Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
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DOI: 10.1016/j.apsusc.2016.10.186
Abstract: Abstract In this paper epitaxial ZnSe thin films prepared by molecular beam epitaxy onto GaAs single crystal substrates exhibiting two defects, i.e. boundary roughness and thickness non-uniformity, are optically characterized using a combination of spectroscopic… read more here.
Keywords: thickness non; thin films; znse thin; non uniformity ... See more keywords
Effect of boundary roughness on the attenuation of specular phonon reflection in graphene
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DOI: 10.1103/physrevb.109.184207
Abstract: The reduced phonon specularity $p$ from boundary roughness scattering plays a major role in the lower thermal conductivity in semiconducting and insulating nanowires and films. Although the well-known Ziman formula $p=\exp(-4\sigma^{2}q_{x}^{2})$, where $\sigma$ and $q_{x}$… read more here.
Keywords: phonon; roughness; roughness attenuation; boundary roughness ... See more keywords