Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2016.10.186
Abstract: Abstract In this paper epitaxial ZnSe thin films prepared by molecular beam epitaxy onto GaAs single crystal substrates exhibiting two defects, i.e. boundary roughness and thickness non-uniformity, are optically characterized using a combination of spectroscopic… read more here.
Keywords: thickness non; thin films; znse thin; non uniformity ... See more keywords