Unveiling the Vulnerability of Oxide-Breakdown-Based PUF
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DOI: 10.1109/led.2024.3369860
Abstract: This work reports a potential vulnerability of an oxide-breakdown-based Physical Unclonable Function (PUF). This generates a unique chip key based on the stochastic competition between the formation of oxide breakdown in pairs of identical transistors.… read more here.
Keywords: vulnerability oxide; unveiling vulnerability; breakdown based; puf ... See more keywords