Application of the Clustering Model to Time-Correlated Oxide Breakdown Events in Multilevel Antifuse Memory Cells
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DOI: 10.1109/led.2020.3033709
Abstract: Time statistics for successive breakdown (BD) events in Al2O3/HfO2-based nanolaminates aimed to the development of multilevel one-time programmable (OTP) memory cells is investigated. The clustering model is shown to account for the departure of the… read more here.
Keywords: clustering model; time; sub sub; breakdown events ... See more keywords