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Published in 2020 at "Journal of Electronic Materials"
DOI: 10.1007/s11664-020-08177-9
Abstract: The effect of annealing on the performance of conductive-bridging random-access memory (CBRAM) with an amorphous gallium oxide (a-Ga2O3) switching layer has been studied. After annealing at 200°C in N2, a significant improvement of the bipolar…
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Keywords:
conductive bridging;
random access;
bridging random;
performance ... See more keywords