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Published in 2021 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2020.3038368
Abstract: The use of both broadside (launch-on-capture) and skewed-load (launch-on-shift) tests for delay faults results in increased delay fault coverage and better test compaction than the use of a single test type. Two-cycle broadside and skewed-load…
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Keywords:
skewed load;
scan enable;
broadside skewed;
test ... See more keywords