STABLE: Stress-Aware Boolean Matching to Mitigate BTI-Induced SNM Reduction in SRAM-Based FPGAs
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Transactions on Computers"
DOI: 10.1109/tc.2017.2725952
Abstract: Biased-Temperature-Instability (BTI) aging mechanism reduces Static-Noise-Margin (SNM) of SRAM cells. This leads to a higher Soft-Error-Rate (SER), lower reliability, and lower SRAMs’ stability in FPGAs. SNM partially improves by leveraging the recovery phase of BTI… read more here.
Keywords: bti; stress aware; induced snm; snm reduction ... See more keywords
Extracting Voltage Dependence of BTI-induced Degradation Without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Semiconductor Manufacturing"
DOI: 10.1109/tsm.2020.2983060
Abstract: Measuring bias temperature instability (BTI) by ring oscillators (ROs) is frequently used. However, the performance of a semiconductor chip is fluctuated dynamically due to bias, temperature and etc. BTI-sensitive and -insensitive ROs are implemented in… read more here.
Keywords: induced degradation; bti sensitive; bti induced; degradation without ... See more keywords