Synergistic Effect of BTI and Process Variations on the Soft Error Rate Estimation in Digital Circuits
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DOI: 10.1109/access.2022.3183137
Abstract: Soft errors, aging effects and process variations have become the three most critical reliability issues for nanoscale complementary metal oxide semiconductor (CMOS) circuits. In this paper, the effects of bias temperature instability (BTI) and process… read more here.
Keywords: process variations; synergistic effect; bti process; effect ... See more keywords