An in-Array Build-In Self-Test Scheme for Embedded SRAM Array
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DOI: 10.1109/tcsii.2024.3375637
Abstract: An in-array Build-In Self-Test (BIST) scheme is proposed for the embedded SRAM array. The linear feedback shift register (LFSR) is used to implement the pattern generator, and the single/multiple-input signature register (SISR/MISR) is used to… read more here.
Keywords: scheme; build self; self test; array build ... See more keywords