Circuit modeling of the electro-thermal behavior of nanoscale bulk-FinFETs
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DOI: 10.1007/s10825-017-1058-8
Abstract: Because the selfheating effect (SE) influences the performance and reliability of gate oxide and interconnect lines, and SE is affected by circuit operation such as operating frequency, the spatial distribution and dynamic behaviors of SE… read more here.
Keywords: circuit modeling; bulk finfets; circuit; finfets circuit ... See more keywords
Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2017.2706265
Abstract: FinFETs and ultrathin body and buried oxide fully depleted silicon on insulator (UTBB-FDSOI) are the main transistors currently used in advanced integrated circuits (ICs). The tunable electrical properties via back-biasing facilitate the threshold voltage adjustment… read more here.
Keywords: soi finfets; bulk finfets; utbb fdsoi; back biasing ... See more keywords