Density of bunched threading dislocations in epitaxial GaN layers as determined using X-ray diffraction
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DOI: 10.1063/1.5009521
Abstract: X-ray diffraction is one of the most popular experimental methods employed for determination of dislocation densities, as it can recognize both the strain fields and the local lattice rotations produced by dislocations. The main challenge… read more here.
Keywords: ray diffraction; dislocation; diffraction; bunched threading ... See more keywords