Understanding and controlling the depth sensitivity of scanning probe based infrared imaging and nanospectroscopy for buried polymeric structures.
Sign Up to like & getrecommendations! Published in 2023 at "Nanoscale"
DOI: 10.1039/d3nr01657a
Abstract: Atomic force microscopy paired with infrared spectroscopy (AFM-IR) is a robust technique for investigating complex polymer blends and composites' nanoscale surface topography and chemical composition. In this work, we measured bilayer polymer films to study… read more here.
Keywords: sensitivity; buried polymeric; polymeric structures; depth sensitivity ... See more keywords