A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress
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DOI: 10.1109/tc.2022.3199994
Abstract: Burn-In test equipment usually owns extensive memory capabilities to store pre-computed patterns to be applied to the circuit inputs as well as ad-hoc circuitries to drive and read the DUT pins during the BI phase.… read more here.
Keywords: supply; burn tester; tester; low cost ... See more keywords