General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
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DOI: 10.1107/s2052252520014165
Abstract: A general method to calculate the elastic deformation and X-ray diffraction curves of arbitrarily shaped, toroidally bent crystal wafers based on the free-energy minimization is presented. read more here.
Keywords: ray diffraction; calculate elastic; general method; elastic deformation ... See more keywords