Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.
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DOI: 10.1017/s1431927618001071
Abstract: The development of high-speed pixelated electron detectors has presented many opportunities for Scanning Transmission Electron Microscopy (STEM). The collection of Convergent-Beam Electron Diffraction (CBED) patterns as a function of probe position provides a feature rich… read more here.
Keywords: cbed patterns; calculation cbed; microscopy; accurate calculation ... See more keywords