Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
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DOI: 10.1109/temc.2016.2644616
Abstract: We discuss a fundamentally new method for electric (E) field strength (V/m) metrology applicable to the near-field. This new approach is significantly different from currently used field measurement techniques in that it is based on… read more here.
Keywords: field; near field; calibrated measurements; self calibrated ... See more keywords