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Published in 2019 at "Applied Physics Letters"
DOI: 10.1063/1.5121629
Abstract: Dopant diffusion and structural defects are investigated in a carbon-phosphorus implanted silicon. End-of-range defects maturation and phosphorus diffusion are inhibited. A direct imaging of carbon segregation to dislocation loops is given by atom probe tomography.…
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Keywords:
implanted silicon;
carbon;
phosphorus;
carbon segregation ... See more keywords
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Published in 2017 at "Philosophical Magazine Letters"
DOI: 10.1080/09500839.2016.1250966
Abstract: Abstract Carbon segregation in Cr8Mo2SiV tool steel after common heat treatment (CHT) and deep cryogenic treatment (DCT) has been investigated by X-ray diffraction (XRD), transmission electron microscopy (TEM) extraction replica and three-dimensional atom probe (3DAP)…
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Keywords:
carbon;
segregation cr8mo2siv;
treatment;
carbon segregation ... See more keywords