Evaluation of Single-Event Effect Current-Carrier Mapping Based on Experimental Data
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DOI: 10.3390/mi15111353
Abstract: For single-event radiation damage of power MOSFET devices, this paper aims to establish a statistical analysis method based on external observation (gate/drain current characteristics in irradiation environment) to recognize and evaluate the radiation evolution process… read more here.
Keywords: single event; damage; current carrier; carrier mapping ... See more keywords