Catastrophic optical damage in 808 nm broad area laser diodes: a study of the dark line defect propagation.
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DOI: 10.1364/oe.463313
Abstract: We present a study of the propagation of dark line defects (DLDs) in catastrophically damaged 808 nm laser diodes, based on cathodoluminescence (CL) measurements and laser mode propagation simulations. Room temperature CL images show blurred DLDs… read more here.
Keywords: optical damage; laser diodes; catastrophic optical; dark line ... See more keywords