Interfaces Between CdTe and ALD Al2O3
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DOI: 10.1109/jphotov.2018.2870139
Abstract: We present a combination of X-ray photoelectron spectroscopy (XPS) and time-resolved photoluminescence (TRPL) to probe the details of interface formation between CdTe and alumina deposited by atomic layer deposition (ALD). Alumina ALD using water as… read more here.
Keywords: interfaces cdte; al2o3; spectroscopy; cdte ald ... See more keywords