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1
Published in 2018 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/aab018
Abstract: In this Part 2 of this series of articles, the procedure proposed in Part 1, namely a new parameter extraction technique of the shunt resistance (R sh ) and saturation current (I sat ) of…
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Keywords:
shunt resistance;
part;
cdte cigs;
saturation current ... See more keywords