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Published in 2020 at "Applied Physics Letters"
DOI: 10.1063/5.0029546
Abstract: Observation at low voltage using scanning electron microscopes (SEMs) enables the characterization of surface details on specimens on a nanometer scale and is widely used in science and industry. However, the energy width of the…
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Keywords:
cold field;
monochromatic electron;
ceb6 310;
electron ... See more keywords