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Published in 2022 at "IEEE Transactions on Circuits and Systems II: Express Briefs"
DOI: 10.1109/tcsii.2022.3200923
Abstract: Conventional diagnosis methods are performed at the library cell level, which identify only defective cells. In reality, many defects affecting the inside of the cells cannot be identified, limiting yield improvement. To overcome the limit,…
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Keywords:
scan chain;
cell;
diagnosis;
cell aware ... See more keywords