Articles with "chain faults" as a keyword



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Improving the Diagnosability of Scan Chain Faults Under Transparent-Scan by Observation Points

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Published in 2018 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2017.2748020

Abstract: Observation points in the combinational logic of a circuit can aid in the diagnosis of logic defects by reducing the number of indistinguished fault pairs. This paper considers the use of observation points in the… read more here.

Keywords: chain; chain faults; combinational logic; observation points ... See more keywords