Growth and characterization of detector-grade CdMnTe by the vertical Bridgman technique
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DOI: 10.1063/1.5040362
Abstract: We grew Cd1-xMnxTe crystals with a nominal Mn concentration of 5% by the vertical Bridgman growth technique. The compositional variation along the length of the grown ingot was studied by powder X-ray diffraction. The composition… read more here.
Keywords: growth characterization; growth; characterization detector; vertical bridgman ... See more keywords