Electrical characterization of molybdenum oxide lamellar crystals irradiated with UV light and proton beams
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DOI: 10.1016/j.surfcoat.2018.01.034
Abstract: Abstract MoO 3 lamellar single crystals were processed into planar metal-semiconductor-metal devices and subjected to irradiation cycles with ultraviolet light and 2 MeV protons in vacuum. In-situ electrical characterization demonstrates that these sensor devices respond well… read more here.
Keywords: characterization molybdenum; oxide lamellar; proton; electrical characterization ... See more keywords