Volatility Characterization for RRAM Devices
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DOI: 10.1109/led.2016.2631631
Abstract: Emerging technologies, such as resistive random access memory (RRAM), are being actively researched for its potential applications in developing new technologies inspired by brainlike neuromorphic computing. However, developing automated characterization algorithms for the metastable resistive… read more here.
Keywords: characterization rram; rram devices; volatility characterization; rram ... See more keywords