Contactless Electrical and Structural Characterization of Semiconductor Nanowires with Axially Modulated Doping Profiles.
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DOI: 10.1002/smll.201805140
Abstract: Efficient characterization of semiconductor nanowires having complex dopant profiles or heterostructures is critical to fully understand these materials and the devices built from them. Existing electrical characterization techniques are slow and laborious, particularly for multisegment… read more here.
Keywords: contactless electrical; characterization semiconductor; nanowires axially; semiconductor nanowires ... See more keywords