Broadband Characterization of Silicate Materials for Potential 5G/6G Applications
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DOI: 10.1109/tim.2023.3256463
Abstract: This article provides a broadband dielectric characterization of different silicate substrates up to 115 GHz, to fill the gap in the properties of different kinds of glasses in a broad part of the mm-wave spectrum.… read more here.
Keywords: silicate; characterization silicate; silicate materials; loss ... See more keywords