In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials
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DOI: 10.1017/s1431927618009911
Abstract: 1. National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 2. School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing… read more here.
Keywords: characterization ultra; tem characterization; situ tem; physics ... See more keywords