Characterizing transition-metal dichalcogenide thin-films using hyperspectral imaging and machine learning
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DOI: 10.1038/s41598-020-68321-7
Abstract: Atomically thin polycrystalline transition-metal dichalcogenides (TMDs) are relevant to both fundamental science investigation and applications. TMD thin-films present uniquely difficult challenges to effective nanoscale crystalline characterization. Here we present a method to quickly characterize the… read more here.
Keywords: characterizing transition; thin films; films using; transition metal ... See more keywords