Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET
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DOI: 10.1016/j.microrel.2019.113449
Abstract: Abstract This paper presents an investigation of the effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of SiO2 dielectric nMOSFET. In contrast to the conventional degradation behavior, saturation threshold voltage degradation… read more here.
Keywords: degradation; trapped charge; oxide trapped; charge ... See more keywords