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Published in 2017 at "Physics of the Solid State"
DOI: 10.1134/s1063783417080212
Abstract: The effects of charging of dielectric targets irradiated with moderate-energy electrons in a scanning electron microscope are examined. Considerable differences in the kinetics of charging of the reference samples and the samples preirradiated with ions…
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Keywords:
beam charging;
electron beam;
charging dielectrics;
ions electrons ... See more keywords