High-resolution 3D shape measurement with extended depth of field using fast chromatic focus stacking.
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DOI: 10.1364/oe.454856
Abstract: Close-range 3D sensors based on the structured light principle have a constrained measuring range due to their depth of field (DOF). Focus stacking is a method to extend the DOF. The additional time to change… read more here.
Keywords: dof; focus stacking; chromatic focus; focus ... See more keywords
Chromatic focus variation microscopy for surface metrology.
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DOI: 10.1364/oe.528285
Abstract: Optical metrology plays a vital role in a wide range of research and inspection areas in the industry. At present, the market offers a variety of optical metrology instruments, among which the focus variation microscope… read more here.
Keywords: focus variation; chromatic focus; metrology; objective lens ... See more keywords