Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip Applications
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DOI: 10.1109/ted.2020.3020904
Abstract: This article explores the scope of drain-extended FinFET (DeFinFET) as a high-voltage (HV) device contender for Fin-based SoC applications. For the first time, guidelines for efficient and reliable HV integration in sub-14 nm FinFET nodes… read more here.
Keywords: drain; device circuit; circuit reliability; drain extended ... See more keywords