Review of Methodologies for Evaluating Short-Circuit Robustness and Reliability of SiC Power MOSFETs
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DOI: 10.1109/jestpe.2021.3136746
Abstract: To accelerate the broad application of silicon carbide (SiC) power MOSFETs, their short-circuit (SC) robustness and reliability must be thoroughly evaluated. This article, therefore, presents an overview of related research methods aiming to meet that… read more here.
Keywords: short circuit; circuit robustness; power; reliability ... See more keywords