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Published in 2020 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2020.145903
Abstract: Abstract The study of the chemical composition of buried interfaces by X-ray photoelectron spectroscopy (XPS) is limited by the inelastic mean free path of emitted photoelectrons (PE). Soft X-ray sources (AlKα) are generally suitable for…
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Keywords:
gas cluster;
gap;
ion beam;
xps ... See more keywords
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Published in 2022 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2021.151467
Abstract: Abstract The gas cluster ion beam (GCIB) is a valuable tool for surface analysis, providing new 3D mass analysis equipment possibilities. The main feature of the GCIB is that many particles are involved during the…
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Keywords:
ion beam;
gas;
co2;
ion ... See more keywords
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Published in 2018 at "Physical Review B"
DOI: 10.1103/physrevb.97.035146
Abstract: We have investigated the effects of low-energy ion beam irradiations using argon clusters on the chemical and electronic properties of LaAlO3/SrTiO3 (LAO/STO) heterointerfaces by combining x-ray photoelectron spectroscopy (XPS) and electrical transport measurements. Due to…
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Keywords:
cluster ion;
surface;
electronic properties;
ion ... See more keywords
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Published in 2017 at "Materials"
DOI: 10.3390/ma10091056
Abstract: In this study, we used a 30 keV argon cluster ion beam bombardment to investigate the dynamic processes during nano-ripple formation on gold surfaces. Atomic force microscope analysis shows that the gold surface has maximum…
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Keywords:
surface;
bombardment;
cluster ion;
nano ripple ... See more keywords
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2
Published in 2022 at "Nanomaterials"
DOI: 10.3390/nano12040670
Abstract: In this paper, the influence of surface modification on the characteristics and properties of AlN thin films on Si and glass-ceramics substrates is investigated. The surface modification was made at various parameters of argon cluster…
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Keywords:
cluster ion;
influence;
surface;
cluster ... See more keywords