Determination of DC equivalent hot carrier stress times in scaled CMOS devices using novel AC stress methodology
Sign Up to like & getrecommendations! Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2018.12.012
Abstract: Abstract A new AC hot carrier injection (HCI) test methodology replicating the switching in digital CMOS circuits is introduced to correlate HCI in discrete scaled CMOS devices to HCI in logic circuits. This technique allows… read more here.
Keywords: hot carrier; methodology; cmos devices; stress ... See more keywords
Scaling carbon nanotube complementary transistors to 5-nm gate lengths
Sign Up to like & getrecommendations! Published in 2017 at "Science"
DOI: 10.1126/science.aaj1628
Abstract: Moving transistors downscale One option for extending the performance of complementary metal-oxide semiconductor (CMOS) devices based on silicon technology is to use semiconducting carbon nanotubes as the gates. Qiu et al. fabricated top-gated carbon nanotube… read more here.
Keywords: carbon; nanotube field; transistors gate; carbon nanotube ... See more keywords
Memristive and CMOS Devices for Neuromorphic Computing
Sign Up to like & getrecommendations! Published in 2020 at "Materials"
DOI: 10.3390/ma13010166
Abstract: Neuromorphic computing has emerged as one of the most promising paradigms to overcome the limitations of von Neumann architecture of conventional digital processors. The aim of neuromorphic computing is to faithfully reproduce the computing processes… read more here.
Keywords: cmos devices; memristive cmos; neuromorphic computing; devices neuromorphic ... See more keywords