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Published in 2019 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2019.04.002
Abstract: In this paper we discuss probe properties in terms of probe currents, probe sizes, energy spread, virtual source sizes, and brightness in a 1.2-MV cold field-emission (cold FE) transmission electron microscope (TEM) equipped with a…
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Keywords:
cold field;
brightness;
field emission;
electron microscope ... See more keywords
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Published in 2019 at "Applied Physics Letters"
DOI: 10.1063/1.5097676
Abstract: Cold field emission sources are capable of providing highly coherent and bright electron beams. However, they suffer from some well-known practical difficulties that have prevented their widespread use: unmanageably stringent ultrahigh vacuum requirements, relatively large…
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Keywords:
cold field;
field;
cathode;
field emission ... See more keywords
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Published in 2020 at "Applied Physics Letters"
DOI: 10.1063/5.0029546
Abstract: Observation at low voltage using scanning electron microscopes (SEMs) enables the characterization of surface details on specimens on a nanometer scale and is widely used in science and industry. However, the energy width of the…
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Keywords:
cold field;
monochromatic electron;
ceb6 310;
electron ... See more keywords