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Published in 2017 at "Technical Physics Letters"
DOI: 10.1134/s1063785017100029
Abstract: Charge capture on flash-memory test structures with floating gates made of graphene (few-layer graphene) and its compounds (graphene oxide and partially fluorinated graphene) is investigated. A comparison of the memory window for different structures has…
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Keywords:
comparison flash;
memory elements;
elements using;
graphene ... See more keywords