Articles with "complete workflow" as a keyword



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A Complete Workflow for Subnanometer Resolution Subtomogram Averaging In Situ

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Published in 2020 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927620018735

Abstract: Subtomogram averaging provides capabilities normal CryoEM single particle reconstruction does not. First, it permits study of highly flexible assemblies in which the single view provided by single particle analysis produces ambiguous results. More importantly, however,… read more here.

Keywords: resolution; subnanometer resolution; complete workflow; subtomogram averaging ... See more keywords