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Published in 2017 at "CEAS Space Journal"
DOI: 10.1007/s12567-017-0156-6
Abstract: Optical components realized for space applications have to be mastered in term of parasitic light. This paper present the last improvements performed at the Institute Fresnel to predict and measure scattering losses of optical components…
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Keywords:
scattered complex;
complex optical;
light scattered;
optical coatings ... See more keywords
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Published in 2018 at "Nature Communications"
DOI: 10.1038/s41467-018-05932-9
Abstract: The complex optical susceptibility is the most fundamental parameter characterizing light-matter interactions and determining optical applications in any material. In one-dimensional (1D) materials, all conventional techniques to measure the complex susceptibility become invalid. Here we…
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Keywords:
susceptibility;
carbon nanotubes;
complex optical;
optical susceptibility ... See more keywords
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Published in 2018 at "Journal of Materials Chemistry C"
DOI: 10.1039/c8tc03222j
Abstract: Knowledge of the complex optical constants of the hybrid perovskite CsPbBr3 in thin films is essential for their applications in optoelectronic devices. In this paper, we measured the optical constants of a perovskite CsPbBr3 thin…
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Keywords:
microscopy;
cspbbr3 thin;
optical constants;
thin film ... See more keywords
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Published in 2022 at "Nanoscale"
DOI: 10.1039/d1nr07770h
Abstract: As nanocrystals (NCs) gain maturity, they become central building blocks for optoelectronics in devices such as solar cells and, more recently, infrared focal plane arrays. Now that the proof of concept of these devices has…
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Keywords:
optical index;
thin films;
index;
short wave ... See more keywords
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Published in 2023 at "Micromachines"
DOI: 10.3390/mi14061142
Abstract: Complex optical elements have the advantages of improving image quality and optical performance and expanding the field of view. Therefore, it is widely used in X-ray scientific devices, adaptive optical elements, high-energy laser systems, and…
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Keywords:
optical metrology;
focal plane;
complex optical;
metrology ... See more keywords