Evaluation of the Component of Bias of X-Ray Microanalysis Related to Surface Relief of the Specimen
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DOI: 10.1134/s0020168517140163
Abstract: A semiempirical approach to the a priori evaluation of the effect of the surface relief on the results of X-ray spectral analysis of binary compounds is proposed. Dimensionless parameter k characterizing the effect of the… read more here.
Keywords: relief; surface relief; component bias; evaluation component ... See more keywords