The Study of the Reliability of Complex Components during the Electromigration Process
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DOI: 10.3390/mi14030499
Abstract: With the increasing number of inputs and outputs, and the decreasing interconnection spacing, electrical interconnection failures caused by electromigration (EM) have attracted more and more attention. The electromigration reliability and failure mechanism of complex components… read more here.
Keywords: reliability complex; components electromigration; complex components; electromigration ... See more keywords