Theoretical consideration of electromigration damage around a right-angled corner in a passivated line composed of dissimilar metals
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DOI: 10.1007/s00542-016-3178-7
Abstract: Electromigration (EM) evaluation near contact corners in interconnection structures composed of dissimilar materials in particular is becoming increasingly important. A theoretical analysis of the atomic density distribution around a right-angled corner in a passivated line… read more here.
Keywords: atomic density; line; right angled; composed dissimilar ... See more keywords