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Published in 2024 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2023.3307352
Abstract: Distributed test data compression refers to the scenario where each logic block in a design has its own decompression logic and compact set of compressed tests. A static test compaction procedure for this scenario was…
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Keywords:
compressed test;
test compaction;
logic;
test ... See more keywords