Articles with "compressed test" as a keyword



Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks

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Published in 2024 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2023.3307352

Abstract: Distributed test data compression refers to the scenario where each logic block in a design has its own decompression logic and compact set of compressed tests. A static test compaction procedure for this scenario was… read more here.

Keywords: compressed test; test compaction; logic; test ... See more keywords