Sharing of Compressed Tests Among Logic Blocks
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DOI: 10.1109/tvlsi.2023.3244804
Abstract: In a design that consists of several logic blocks, each logic block may be tested separately using its own compressed test set and on-chip decompression logic. The decompression logic is typically based on a linear… read more here.
Keywords: compressed tests; among logic; sharing compressed; logic blocks ... See more keywords