What is the dopant concentration in polycrystalline thin-film Cu(In,Ga)Se2?
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DOI: 10.1016/j.tsf.2016.09.038
Abstract: We compare the dopant concentration of polycrystalline Cu(In,Ga)Se2 thin film absorbers derived from Hall and capacitance-voltage measurements. Although both measurements techniques appear to be reliable, dopant concentrations determined by capacitance-voltage analysis are significantly lower and… read more here.
Keywords: dopant concentration; se2; thin film; concentration polycrystalline ... See more keywords