A Scheme to Design Concurrent Error Detection Techniques for the Fast Fourier Transform Implemented in SRAM-Based FPGAs
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DOI: 10.1109/tc.2018.2792445
Abstract: Soft errors are an important issue for SRAM-based Field Programmable Gate Arrays (FPGAs), since they result in permanent alterations of the mapped circuit when they affect their configuration memory. Concurrent Error Detection (CED) techniques, such… read more here.
Keywords: concurrent error; detection; error; fast fourier ... See more keywords