Articles with "conductive atomic" as a keyword



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Vertical Conductivity and Topography in Electrostrictive Germanium Sulfide Microribbon via Conductive Atomic Force Microscopy.

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Published in 2022 at "Nano letters"

DOI: 10.1021/acs.nanolett.2c02763

Abstract: Layered group IV monochalcogenides are two-dimensional (2D) semiconducting materials with unique crystal structures and novel physical properties. Here, we report the growth of single crystalline GeS microribbons using the chemical vapor transport process. By using… read more here.

Keywords: topography; force microscopy; microscopy; atomic force ... See more keywords
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Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy

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Published in 2023 at "ACS Applied Materials & Interfaces"

DOI: 10.1021/acsami.3c01102

Abstract: Conductive atomic force microscopy (CAFM) is a powerful technique to investigate electrical and mechanical properties of materials and devices at the nanoscale. However, its main challenge is the reliability of the probe tips and their… read more here.

Keywords: force microscopy; microscopy; conductive atomic; solid probes ... See more keywords
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Moiré fringes in conductive atomic force microscopy

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Published in 2023 at "Applied Physics Letters"

DOI: 10.1063/5.0145173

Abstract: Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on the observation of moiré fringes in… read more here.

Keywords: moir fringes; microscopy; atomic force; fringes conductive ... See more keywords
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Identification of polar and nonpolar faces in ZnO nanostructures using conductive atomic force microscopy

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Published in 2017 at "Ferroelectrics"

DOI: 10.1080/00150193.2017.1361239

Abstract: ABSTRACT Here we present the local electrical characterization of individual ZnO nanorods (NRs) synthesized by spin coating method using precursor sol. Conductive atomic force microscopy (CAFM) was employed for investigating the local conductivity of these… read more here.

Keywords: microscopy; force microscopy; zno; polar nonpolar ... See more keywords
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Electrical characterization of tumor-derived exosomes by conductive atomic force microscopy

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Published in 2022 at "Nanotechnology"

DOI: 10.1088/1361-6528/ac4d57

Abstract: The physical properties of tumor-derived exosomes have gained much attention because they are helpful to better understand the exosomes in biomedicine. In this study, the conductive atomic force microscopy (C-AFM) was employed to perform the… read more here.

Keywords: derived exosomes; force microscopy; microscopy; conductive atomic ... See more keywords