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Published in 2020 at "Solar Energy"
DOI: 10.1016/j.solener.2020.09.020
Abstract: Abstract Mid-infrared spectroscopic characterization of doped layers is a rapid, contactless and non-destructive method of determining doped semiconductor layer properties, being used as an inline monitoring tool in industrial environments. Extending this technique to transparent…
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Keywords:
characterization modelling;
characterization;
mid infrared;
transparent conductive ... See more keywords
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Published in 2018 at "IEEE Sensors Journal"
DOI: 10.1109/jsen.2018.2852561
Abstract: Exploitation of transparent conductive oxides (TCOs) to implement an energy-autonomous sensor node for a wireless sensor network is studied and a practical solution presented. In the practical implementations, flexible and rigid substrates, i.e., polyimide and…
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Keywords:
exploitation transparent;
transparent;
sensor node;
transparent conductive ... See more keywords